RAITH 150 TWO

 RAITH 50

      
 
  ...offers modern EBL system
  architecture AND its mini-environment
  renders infra structure investments
  unnessecary....is the right choice for
 
 
  Researchers and universities
   - Easy to learn and to use for all skill
     levels.
   - Multi-user management supports concurrent
     access by multiple users with different
     privileges.
 
  industrial and academic development
  groups
   - Professional-grade GDSII design files
   - Automated task lists
   - Device, wafer or mask level operation
 
  Centralized nano and service centers
   - Multi-project wafer exposures
   - Fastest operation speed
   - Well-established support with professional
     support teams
 
  enables extensive applications
   - Ultra High Resolution (UHR) exposures
   - Mix-and-match with optical lithography
   - Advanced device prototyping
   - High resolution template writing
   - Optical devices with zero stitching error
 
  Writing mode
   - Sub 10 nm lithography
   - Unsurpassed mark recognition technology
   - Automatic loadlock
   - Up to 7" mask / 8" wafer handling
   - Automatic focus correction
   - Automatic sample leveling
   - Unique zero stitching exposure mode (FBMS)
   - Most comprehensive user interface
 
  Inspection mode
   - UHR inspection for
     > Process development and control
          > Pattern and device metrology
        - Various rotation and tilt angles
        - Intuitive sample navigation
 
   
 
  RAITH50 is a general purpose electron
  beam lithography tool used for research
  and developments in the fields of MEMS
  and diffractive optical elements.
 
  It can handle samples up to 2" square
 
  Key applications
      - Direct write on up to 2 inch samples with
          sub 100 nm resolution, ideal for MEMS
          applications.
      - Optical elements like photonic crystals,
          beam splitters, gratings, DFB lasers or
          waveguides.
      - Metrology, SEM inspection and sample
          navigation
    Key hardware features
      - LaB6 emitter, W optional.
      - Laser interferometer stage with 45 mm by
          45 mm travel range and 2 nm resolution
          achieved by closed-loop piezo-positioning.
      - 10 MHz DSP-controlled digital pattern
          generator.
 
    RAITH50 specifications
      - Minimum line width < 50 nm
      - Stitching accuracy 80 nm
      - Overlay accuracy 80 nm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 

Homepage : http://www.raith.com  

 

 ion LINE

  e_LINE

  
 
  ionLINE is a novel ion beam lithography,
  nanofabrication and engineering 
  workstation for low dose applications
  in surface science,thin film engineering
  and applied physics research.
 
  Designed in an uncompromised nanolithography
  system architecture, ionLiNE represents a new
  instrument class for research and development.
  ionLINE as dedicated ion beam nanolithography,
  fabrication, and engineering instrument offers
  unique opportunities for exciting research
  results.
  The patented Nano FIB TM ion optics provides
  overnight beam current stability required for
  advanced and automated patterning.
  Low beam tails offer high selectivity.
  For applications covering large areas, a laser
  interferometer controlled stage is integrated.
 
  Key applications
   - Low dose ion events
   - Thin film engineering
   - Surface functionalisation
   - Localised defect injection
 
  For advanced nanoengineering, ionLiNE
  can be configured with nanomanipulators
  and a gas injection system.
 
Benefit Feature
Automated ion beam fabrication capabilities Designed in nanolithography tool architecture
Superior beam current and beam position stability Patented NanoFIB column concept non tilted laser interferometer stage
High lateral selectivity of ion beam Specialised ion optics design
Low dose application regime High speed 16 bit pattern generator with nanosecond ion dose control
Patterning and blind navigation on large areas Closed loop laser interferometer stage control and top view optical microscope
Guaranteed nanofabrication performance Integrated ion optics, patterning, nanofabrication and engineering software suite
Ease and reliability of operation Multi user management and one integrated software platform
 
  e_LINE is a ultra high resolution 
  electron beam lithography system and
  nanoengineering workstation for
  universities and other academic
  institutions.
 
  Selected options for nanomanipulation, EBID
  and EBIE expand this system to a versatile
  nano-engineering workstation.
  The state-of-the-art e_LiNE electron column
  matches perfectly with a number of key
  applications in CNT research, thin film
  engineering, photonic crystals and EBID.
 
  Key applications
   - Lithography on 4 inch samples
   - EBID and EBIE
   - In-situ electrical measurements and
     nanomanipulation, e.g. CNT or nanorods
 
  Basic hardware features
   - Thermal assisted field emission gun
   - Cross-over free column with highest beam
     current density at 2 nm spot size
   - Laser interferometer stage with 100 mm by
     100 mm travel range and 2 nm resolution
     achieved by closed-loop piezo-positioning.
   - 10 MHZ DSP-controlled digital pattern
     generator.
   - Optional gas injection system,
     nanomanipulators, EDX, optical microscope,
     loadlock, rotation and tilt module, FBMS
     mode exposure

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Homepage : http://www.raith.com  

 

 ELPHY Plus

  ELPHY Quantum

 
    ELPHY Plus is a high end advanced  
    lithography package for your SEM or FIB,  
    and is typically chosen for use for  
    Field Emission SEM or FIB with  
    electrostatic deflection.  
 
  The high speed ELPHY Plus hardware
  architecture offers lowest noise, best signal
  quality and stability even at high writing
  speeds.
  No PC based approach can match the performance
  of the ELPHY Plus hardware.
  Raith's world wide support infrastructure for
  installation and training at your site
  warrants that you will able to pattern and
  inspect results within the shortest possible
  time.
 
  ELPHY software features
   - Hierarchical fully integrated GDSII layout
     editor/viewer
   - Data import for DXF, CIF and ASCII data
   - Exposure parameter adjustment and
     calculation
   - Macro generation and VB scripting
   - Digital image acquisition
   - Line width measurement capabilities
   - SEM/FIB remote control and FIB module
   - A second offline licence is included
   - Optional: Fully integrated proximity effect
     correction and parameter calculation
 
  ELPHY Plus hardware features
   - 6 MHz high-speed pattern generation hardware
     (19inch DSP Unit decoupled from PC)
   - Fast, noise-reduced, deglitched and high
     performance 16 bit DAC vector scan beam
     deflection
   - 16 bit DAC vector scan beam deflection
   - 2 ns writing speed resolution
   - TTL and 100 V blanking signal drivers
   - 12 bit AD channel for reading detector
     signal (image acquisition)
   - TTL signal for FIB/SEM external beam
     control request
   - 3 additional DAC per channel for alignment
     and calibration (hardware for scaling,
     rotation / orthogonality and shift)
   - Decoupling from PC electronics and thermo
     control for main and calibration DACs
 
   
 
  ELPHY Quantum is the most widespread and
  universal lithography attachment for
  SEM & FIB.
 
  All required functions are fully integrated
  into one software, from pattern design,
  exposure parameter management, pattern overlay
  alignment to step and repeat exposures.
 
  ELPHY Quantum hardware is a specifically
  designed 16bit, 2.5 MHz DAC vector scan beam
  deflection PC board installed into a state of
  the art Windows computer.
  Raith´s world wide support infrastructure for
  installation and training at your site warrants
  that you will able to pattern and inspect
  results within the shortest possible time.
 
  ELPHY software features
   - Hierarchical fully integrated GDSII layout
     editor/viewer
   - Data import for DXF, CIF and ASCII data
   - Exposure parameter adjustment and
     calculation
   - Macro generation and VB scripting
   - Digital image acquisition
   - Line width measurement capabilities
   - SEM/FIB remote control and FIB module
   - A second offline licence is included
   - Optional: Fully integrated proximity
     effect correction and parameter calculation
 
  ELPHY Quantum hardware features
   - TTL - blanking signal output
   - TTL - SEM/FIB external scan enable/disable
   - TTL signal for FIB/SEM external beam
     control request
   - 3 additional DAC per channel alignment and
     calibration (hardware for scaling,
     rotation /  orthogonality and shift)  

 

 

 

 

 

 

 

 

 

Homepage : http://www.raith.com